Test probe assembly and test socket
Disclosed is a test probe assembly. The test probe assembly includes: a conductive pipe; a probe inserted in the pipe without contacts and elastically retractable along a lengthwise direction; and aninsulation probe supporting member configured to support the probe between an inner wall of the pipe...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | Disclosed is a test probe assembly. The test probe assembly includes: a conductive pipe; a probe inserted in the pipe without contacts and elastically retractable along a lengthwise direction; and aninsulation probe supporting member configured to support the probe between an inner wall of the pipe and an outer surface of the probe. The test probe assembly of the present disclosure is improved innoise shield performance and convenient in repairing the probe since the probe is mounted to a probe socket as supported in a metal pipe without contacts.
本发明公开一种测试探针模块。所述测试探针模块包括:导电管;探针,被非接触式地插入于所述管中且可沿长度方向弹性伸缩;以及绝缘探针支撑部件,被配置成在所述管的内壁与所述探针的外表面之间支撑所述探针。本发明的测试探针模块在噪声屏蔽效能上得以改良且便于修理探针,乃因探针是通过被非接触式地支撑于金属管中而被安装至探针插座。 |
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