AUTOMATIC DEFECT CLASSIFICATION

A method for automatic defect classification, the method may include (i) acquiring, by a first camera, at least one first image of at least one area of an object; (ii) processing the at least one first image to detect a group of suspected defects within the at least one area; (iii) performing a first classification process for initially classifying the group of suspected defects; (iii) determiningwhether a first subgroup of the suspected defects requires additional information from a second camera for a completion of a classification; (iv) when determining that the first subgroup of the suspected defects requires additional information from the second camera then: (a) acquiring second images, by the second camera, of the first subgroup of the suspected defects; and (b) performing a secondclassification process for classifying the first subgroup of suspected defects. 提供一种用于自动缺陷分类的方法，该方法包括(i)通过第一相机获取对象的至少一个区域的至少一个第一图像；(ii)处理所述至少一个第一图像以检测在所述至少一个区域内的疑似缺陷的组；(iii)进行第一分类过程以初始分类所述疑似缺陷的所述组；(iii)确定所述疑似缺陷的第一子组是否需要来自第二相机