Electron beam additive manufacturing equipment focusing current characteristic parameter collecting device and method

The invention discloses an electron beam additive manufacturing equipment focusing current characteristic parameter collecting device and method. The device comprises a receiving assembly arranged ina vacuum chamber of electron beam additive manufacturing equipment and a signal processing system arr...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: WEI SHOUQI, LI ZHEN, LI ZHAO, DU SHUAIXIANG, WANG HONG, ZHANG TONG, WANG BIN
Format: Patent
Sprache:chi ; eng
Schlagworte:
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