Electron beam additive manufacturing equipment focusing current characteristic parameter collecting device and method
The invention discloses an electron beam additive manufacturing equipment focusing current characteristic parameter collecting device and method. The device comprises a receiving assembly arranged ina vacuum chamber of electron beam additive manufacturing equipment and a signal processing system arr...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses an electron beam additive manufacturing equipment focusing current characteristic parameter collecting device and method. The device comprises a receiving assembly arranged ina vacuum chamber of electron beam additive manufacturing equipment and a signal processing system arranged outside the vacuum chamber of the electron beam additive manufacturing equipment. The receiving assembly is composed of two supports including a feeding support and a material receiving support, two horizontal rolling shafts including a feeding horizontal shaft and a material receiving horizontal shaft, two drums including a feeding drum and a material receiving drum, a metal film, a rolling motor and a beam receiving metal plate. When an electron beam emitted by the electron beam additive manufacturing equipment breaks down the metal film of a working section, and then irradiates to the beam receiving metal plate, electron irradiated to the beam receiving metal plate forms a currentsignal to be imported to t |
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