HANDLING DEVICE FOR HANDLING A MEASURING PROBE

HANDLING DEVICE FOR HANDLING A MEASURING PROBE

The invention relates to a handling device (50) for handling a measuring probe (12) of a scanning probe microscope (81). The measuring probe (12) has a probe body (51) and a probe tip (85) which is coupled to the probe body (51) by means of a cantilever (52), and the handling device (50) has a recei...

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Hauptverfasser: LEUPRECHT GERNOT, PINNO-RATH NORBERT, KOLLER DANIEL
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Sprache:chi ; eng
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APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]
MEASURING
PHYSICS
SCANNING-PROBE TECHNIQUES OR APPARATUS
TESTING
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creator LEUPRECHT GERNOT
PINNO-RATH NORBERT
KOLLER DANIEL
description The invention relates to a handling device (50) for handling a measuring probe (12) of a scanning probe microscope (81). The measuring probe (12) has a probe body (51) and a probe tip (85) which is coupled to the probe body (51) by means of a cantilever (52), and the handling device (50) has a receiving device (53) for receiving the measuring probe (12) on a receiving surface (54); a guide structure (55) in which the measuring probe (12) can be guided and in the process the probe body (51) is bordered at least over a part of the probe body circumference and the cantilever (52) and the probe tip (85) are supported in a contact-free manner; and a transport device (56) for transporting the measuring probe (12) from the receiving surface (54) to a target surface (57) along the guide structure(55). 一种用于操作扫描探针显微镜(81)的测量探针(12)的操作设备(50)，其中测量探针(12)包括探针主体(51)和借助于托架(52)与探针主体(51)耦合的探针尖(85)，其中操作设备(50)包括：容纳装置(53)，该容纳装置用于将测量探针(12)容纳在容纳面(54)上；导向结构(55)，在该导向结构中，测量探针(12)可被引导，并且在此，探针主体(51)被至少部分周向地界定了，并且托架(52)和探针尖(85)被无接触地支承；以及输送
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The measuring probe (12) has a probe body (51) and a probe tip (85) which is coupled to the probe body (51) by means of a cantilever (52), and the handling device (50) has a receiving device (53) for receiving the measuring probe (12) on a receiving surface (54); a guide structure (55) in which the measuring probe (12) can be guided and in the process the probe body (51) is bordered at least over a part of the probe body circumference and the cantilever (52) and the probe tip (85) are supported in a contact-free manner; and a transport device (56) for transporting the measuring probe (12) from the receiving surface (54) to a target surface (57) along the guide structure(55). 一种用于操作扫描探针显微镜(81)的测量探针(12)的操作设备(50)，其中测量探针(12)包括探针主体(51)和借助于托架(52)与探针主体(51)耦合的探针尖(85)，其中操作设备(50)包括：容纳装置(53)，该容纳装置用于将测量探针(12)容纳在容纳面(54)上；导向结构(55)，在该导向结构中，测量探针(12)可被引导，并且在此，探针主体(51)被至少部分周向地界定了，并且托架(52)和探针尖(85)被无接触地支承；以及输送</description><language>chi ; eng</language><subject>APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] ; MEASURING ; PHYSICS ; SCANNING-PROBE TECHNIQUES OR APPARATUS ; TESTING</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20200508&amp;DB=EPODOC&amp;CC=CN&amp;NR=111133319A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20200508&amp;DB=EPODOC&amp;CC=CN&amp;NR=111133319A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LEUPRECHT GERNOT</creatorcontrib><creatorcontrib>PINNO-RATH NORBERT</creatorcontrib><creatorcontrib>KOLLER DANIEL</creatorcontrib><title>HANDLING DEVICE FOR HANDLING A MEASURING PROBE</title><description>The invention relates to a handling device (50) for handling a measuring probe (12) of a scanning probe microscope (81). 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subjects APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]
MEASURING
PHYSICS
SCANNING-PROBE TECHNIQUES OR APPARATUS
TESTING
title HANDLING DEVICE FOR HANDLING A MEASURING PROBE
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