Test system for RFID label weak label screening function
The invention discloses a test system for an RFID label weak label screening function, and belongs to the technical field of RFID label production and manufacturing. The system is novel in structure and clear in working principle, and is structurally formed by connecting a computer host, a testing r...
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| creator | BO LIN GAO FEI ZHANG BING ZHENG KAI XIAO DUNREN WANG LIANG |
| description | The invention discloses a test system for an RFID label weak label screening function, and belongs to the technical field of RFID label production and manufacturing. The system is novel in structure and clear in working principle, and is structurally formed by connecting a computer host, a testing reader, a binding machine, an ink gun, a testing antenna and a testing reader. Communication betweenbinding equipment and the test system is realized through a serial port, so zero delay and consistency of labels and testing results are ensured; the bandwidth of the broadband test antenna is 850-960MHz, so the actual frequency points of different labels can be set for testing, and misreading is reduced; and full-band scanning is carried out in a range of 800-970 MHz, product performance is monitored by setting one or more frequency points, screening of weak-standard products is realized, the production and operation cost can be reduced, the influence of customer complaint abnormity when theweak-standard products flo |
| format | Patent |
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The system is novel in structure and clear in working principle, and is structurally formed by connecting a computer host, a testing reader, a binding machine, an ink gun, a testing antenna and a testing reader. Communication betweenbinding equipment and the test system is realized through a serial port, so zero delay and consistency of labels and testing results are ensured; the bandwidth of the broadband test antenna is 850-960MHz, so the actual frequency points of different labels can be set for testing, and misreading is reduced; and full-band scanning is carried out in a range of 800-970 MHz, product performance is monitored by setting one or more frequency points, screening of weak-standard products is realized, the production and operation cost can be reduced, the influence of customer complaint abnormity when theweak-standard products flo</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; HANDLING RECORD CARRIERS ; PHYSICS ; PRESENTATION OF DATA ; RECOGNITION OF DATA ; RECORD CARRIERS</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200508&DB=EPODOC&CC=CN&NR=111126539A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200508&DB=EPODOC&CC=CN&NR=111126539A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>BO LIN</creatorcontrib><creatorcontrib>GAO FEI</creatorcontrib><creatorcontrib>ZHANG BING</creatorcontrib><creatorcontrib>ZHENG KAI</creatorcontrib><creatorcontrib>XIAO DUNREN</creatorcontrib><creatorcontrib>WANG LIANG</creatorcontrib><title>Test system for RFID label weak label screening function</title><description>The invention discloses a test system for an RFID label weak label screening function, and belongs to the technical field of RFID label production and manufacturing. 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| language | chi ; eng |
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| subjects | CALCULATING COMPUTING COUNTING HANDLING RECORD CARRIERS PHYSICS PRESENTATION OF DATA RECOGNITION OF DATA RECORD CARRIERS |
| title | Test system for RFID label weak label screening function |
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