Test system for RFID label weak label screening function

The invention discloses a test system for an RFID label weak label screening function, and belongs to the technical field of RFID label production and manufacturing. The system is novel in structure and clear in working principle, and is structurally formed by connecting a computer host, a testing reader, a binding machine, an ink gun, a testing antenna and a testing reader. Communication betweenbinding equipment and the test system is realized through a serial port, so zero delay and consistency of labels and testing results are ensured; the bandwidth of the broadband test antenna is 850-960MHz, so the actual frequency points of different labels can be set for testing, and misreading is reduced; and full-band scanning is carried out in a range of 800-970 MHz, product performance is monitored by setting one or more frequency points, screening of weak-standard products is realized, the production and operation cost can be reduced, the influence of customer complaint abnormity when theweak-standard products flo