Defect detection method and device and storage medium

The invention discloses a defect detection method and device and a storage medium. The method comprises the following steps: acquiring N grayscale images of a to-be-tested electronic device under N light sources; acquiring pixel information occupied by defects in the ith grayscale image to form ith...

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Bibliographische Detailangaben
1. Verfasser:	HU TINGPING
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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