Defect detection method and device and storage medium

The invention discloses a defect detection method and device and a storage medium. The method comprises the following steps: acquiring N grayscale images of a to-be-tested electronic device under N light sources; acquiring pixel information occupied by defects in the ith grayscale image to form ith defect position information; according to the line position information of each line of the ith grayscale image and the ith defect position information, determining the defect type of the defect in the ith grayscale image; and according to the defect types from the defect types corresponding to thedefects in the first grayscale image to the defect types corresponding to the defects in the Nth grayscale image, obtaining a defect summary result of the to-be-detected electronic device. According to the embodiment of the invention, the accuracy of defect type judgment can be improved. 本发明公开一种缺陷检测方法和装置、存储介质。该方法通过获取待测电子器件在N种光源下的N个灰度图像；获取第i个灰度图像中的缺陷占用的像素信息形成第i个缺陷位置信息；根据第i个灰度图像的各线路的线路位置信息及第i个缺陷位置信息，确定第i个灰度图像中缺陷的缺陷类型；根据第1个灰