Low-temperature reliability evaluation method for lead-free component interconnection welding spots
The invention provides alow-temperature reliability evaluation method for lead-free component interconnection welding spots. The evaluation method comprises: designing and manufacturing a lead-free solder low-temperature test sample piece; implementing a lead-free solder low-temperature mechanical p...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides alow-temperature reliability evaluation method for lead-free component interconnection welding spots. The evaluation method comprises: designing and manufacturing a lead-free solder low-temperature test sample piece; implementing a lead-free solder low-temperature mechanical property test; analyzing the low-temperature mechanical property of the lead-free solder; and carrying out reliability evaluation on the lead-free solder under the low-temperature condition. According to the method, the problem of material characteristic change caused by ductile-brittle transition possibly occurring to the lead-free electronic component under the low-temperature use condition is considered, and the steps of conducting a lead-free solder mechanical characteristic test under the low-temperature condition and the method for evaluating the reliability of the lead-free solder mechanical characteristic test are given. Compared with a traditional lead-free solder reliability evaluation method, the method h |
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