High-low temperature comprehensive test device for speed reducer

The invention provides a high-low temperature comprehensive test device for a speed reducer. The device comprises a high and low temperature test box. The two sides of the high and low temperature test box are respectively provided with a first through hole and a second through hole; a first mobile...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	WANG WEI, TU KEHENG, SHI JIE, YANG QINGJUN, XU YE, LU YIFAN, ZHAO LINNA, WAN JIANWU, LI LEI
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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