High-low temperature comprehensive test device for speed reducer

The invention provides a high-low temperature comprehensive test device for a speed reducer. The device comprises a high and low temperature test box. The two sides of the high and low temperature test box are respectively provided with a first through hole and a second through hole; a first mobile station; a second mobile station; the input shaft assembly is mounted on the first moving table andmoves along with the first moving table to extend into or out of the first through hole; the output shaft assembly is mounted on the second moving table and moves along with the second moving table toextend into or out of the second through hole; the first heat insulation cylinder is mounted in the high-low temperature test box and covers the first through hole, and a first abdicating hole is formed in the first heat insulation cylinder; the second heat insulation cylinder is mounted in the high-low temperature test box and covers the second through hole, and a second abdicating hole is formed in the second heat insul