Abnormal sample detection device, training device and method thereof
The invention relates to a training device and a training method for training an abnormal sample detection device, and an abnormal sample detection device. A training apparatus according to the present disclosure includes a first reconstruction unit configured to generate a first reconstruction erro...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to a training device and a training method for training an abnormal sample detection device, and an abnormal sample detection device. A training apparatus according to the present disclosure includes a first reconstruction unit configured to generate a first reconstruction error and intermediate feature data based on training sample data as normal sample data; and a back-endprocessing unit configured to generate a second reconstruction error based on the first reconstruction error and the intermediate feature data, in which joint training is performed on the first reconstruction unit and the back-end processing unit based on predetermined criteria regarding the first reconstruction error and the second reconstruction error. The system comprises a first reconstructionunit and a back-end processing unit which are subjected to joint training. Compared with the prior art, the abnormal sample detection device has the advantage that the abnormal sample detection performance can be improved.
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