DYNAMIC ELEMENT MATCHING IN AN INTEGRATED CIRCUIT

An example dynamic element matching (DEM) circuit includes: a plurality of bipolar junction transistors (BJTs) (202), each of the plurality of BJTs having a base terminal and a collector terminal coupled to electrical ground; a plurality of pairs of force switches (204), each pair of force switches coupled to an emitter of a respective one of the plurality of BJTs; a plurality of pairs of sense switches (206), where each pair of sense switches is coupled to the emitter of a respective one of the plurality of BJTs, a first switch in each pair of sense switches is coupled to a first node (Vbe1),and a second switch in each pair of sense switches is coupled to a second node (Vbe2); a first current source (208) coupled to a first switch in each pair of force switches; and a second current source (210) coupled to a second switch in each pair of force switches. 一种示例的动态元件匹配(DEM)电路包括：多个双极性结型晶体管(BJT)(202)，多个BJT的每一个BJT都具有耦接到电接地的基极端和集电极端；多个动力开关对(204)，每一个动力开关对耦接到多个BJT中的分别一个BJT的发射极；多个感测开关对(206)，每一个感测开关对分别耦接到多个BJT中的分别一个BJT的