APPARATUS, SYSTEMS AND METHODS FOR DETECTING ELECTRICAL FAILURES WITHIN COMPUTING DEVICES

Embodiments of the invention relate to apparatus, systems and methods for detecting electrical failures within computing devices. The disclosed method may include (1) monitoring, while a computing device receives power from an external power supply, (A) the amount of power consumed by the computing...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	OKAMURA KATSUHIRO, BOYDEN FRANKLIN D, OWEN DAVID K, SAVINI MICHAEL D, NAIR ANUPAMA PADMINIDEVI KARTHIKEYAN, GILL JASPAL S
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	Embodiments of the invention relate to apparatus, systems and methods for detecting electrical failures within computing devices. The disclosed method may include (1) monitoring, while a computing device receives power from an external power supply, (A) the amount of power consumed by the computing device and (B) the amount of power provided to the computing device by the external power supply, (2) detecting that the amount of power provided to the computing device exceeds the amount of power consumed by the computing device by at least a certain threshold, (3) determining, based on the amountof power provided to the computing device exceeding the amount of power consumed by the computing device by the certain threshold, that the computing device is experiencing a malfunction, and then (4) mitigating potential damage to the computing device due to the malfunction by at least partially reducing the amount of power provided to the computing device from the external power supply. Variousother apparatuses, system