PROBE CARD AND TEST DEVICE INCLUDING THE SAME

There are provided a probe card and a test device including the same. The probe card may include a probe substrate, a plurality of cables on the probe substrate, a plurality of pins on the probe substrate, the plurality of pins being electrically connected to the plurality of cables, and a conductive line on the probe substrate, the conductive line being connected to a ground line. 提供了探针卡和包括探针卡的测试装置。探针卡可包括探针基板、位于探针基板上的多个电缆、位于探针基板上的多个引脚以及位于探针基板上的导电线，其中，多个引脚电连接至多个电缆，导电线连接至接地线。