Method for testing MOSFET

The invention provides a test scheme for a MOSFET. The test scheme comprises the following steps of keeping peripheral connecting lines of a base, a collector and an emitter to a matrix box unchanged,and adjusting a source required by each pin through a Matrix item; adjusting a Matrix channel, and n...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	ZHANG XIUCHEN, BAO ZHIJIE, CHEN HUI
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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