Wafer detection tool

The invention provides a wafer detection tool, which is characterized by comprising a tray and a fixing piece, wherein the tray is provided with an accommodation groove, the bottom of the accommodation groove is provided with a through hole, the depth of the accommodation groove is greater than the...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	GUO KAICHEN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS SEMICONDUCTOR DEVICES TESTING
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