Device and method for completing laser wavelength measurement by using interference principle
The invention relates to a device for completing laser wavelength measurement by using the interference principle. The device comprises a laser source to be measured, a beam splitter, a reflector, a first plane mirror, a second plane mirror, a lens, a photoelectric detector and a processor, the lase...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to a device for completing laser wavelength measurement by using the interference principle. The device comprises a laser source to be measured, a beam splitter, a reflector, a first plane mirror, a second plane mirror, a lens, a photoelectric detector and a processor, the laser source to be measured transmits a laser beam to be measured to the beam splitter, the beam splitter reflects/transmits the laser beam to be measured to the reflector and transmits/reflects the laser beam to be measured to the second plane mirror, and the reflector reflects the received laser beamto be measured to the first plane mirror; the first plane mirror reflects the received laser beam to be measured to the lens, and the second plane mirror reflects the received laser beam to be measured to the lens; and the lens transmits the two received laser beams to be measured to the photoelectric detector, and the processor electrically connected with the photoelectric detector detects an interference phenomenon gene |
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