Testing device of small semiconductor refrigerator

Testing device of small semiconductor refrigerator

The invention provides a testing device of a small semiconductor refrigerator. The testing device is provided with a rectangular base. A door-shaped support is mounted on the base. The door-shaped support is arranged on a platform on the base in a straddling mode. The platform is made of an insulati...

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Hauptverfasser: PAN YUCEN, ZHANG HUANYANG, SONG CHUNZE, LU SIYUAN, LI ZHICHAO
Format: Patent
Sprache:chi ; eng
Schlagworte:
PERFORMING OPERATIONS
POSTAL SORTING
SEPARATING SOLIDS FROM SOLIDS
SORTING
SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTEDPIECE-MEAL, e.g. BY PICKING
TRANSPORTING
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creator PAN YUCEN
ZHANG HUANYANG
SONG CHUNZE
LU SIYUAN
LI ZHICHAO
description The invention provides a testing device of a small semiconductor refrigerator. The testing device is provided with a rectangular base. A door-shaped support is mounted on the base. The door-shaped support is arranged on a platform on the base in a straddling mode. The platform is made of an insulating material. The lower portion of each supporting column of the door-shaped support is provided withan outward-protruding nylon shaft. Square metal rods sleeve the nylon shafts. Probes are fixed to the other ends of the metal rods. Each metal rod is connected to the output end of a direct-current power supply through one wire. An infrared thermometer is arranged on a horizontal cross beam of the door-shaped support. A lens of the thermometer is aligned with needle tips of two probes. The squaremetal rods can rotate around the nylon shafts, so that the probes can be lifted upwards. The testing device can screen out unqualified received materials. It is ensured that waste products caused byunqualified received materi
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN110743822A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN110743822A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN110743822A3</originalsourceid><addsrcrecordid>eNrjZDAKSS0uycxLV0hJLctMTlXIT1Mozk3MyVEoTs3NTM7PSylNLskvUihKTSvKTE8tSgRyeBhY0xJzilN5oTQ3g6Kba4izh25qQX58anFBYnJqXmpJvLOfoaGBuYmxhZGRozExagDyfSx4</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Testing device of small semiconductor refrigerator</title><source>esp@cenet</source><creator>PAN YUCEN ; ZHANG HUANYANG ; SONG CHUNZE ; LU SIYUAN ; LI ZHICHAO</creator><creatorcontrib>PAN YUCEN ; ZHANG HUANYANG ; SONG CHUNZE ; LU SIYUAN ; LI ZHICHAO</creatorcontrib><description>The invention provides a testing device of a small semiconductor refrigerator. The testing device is provided with a rectangular base. A door-shaped support is mounted on the base. The door-shaped support is arranged on a platform on the base in a straddling mode. The platform is made of an insulating material. The lower portion of each supporting column of the door-shaped support is provided withan outward-protruding nylon shaft. Square metal rods sleeve the nylon shafts. Probes are fixed to the other ends of the metal rods. Each metal rod is connected to the output end of a direct-current power supply through one wire. An infrared thermometer is arranged on a horizontal cross beam of the door-shaped support. A lens of the thermometer is aligned with needle tips of two probes. The squaremetal rods can rotate around the nylon shafts, so that the probes can be lifted upwards. The testing device can screen out unqualified received materials. It is ensured that waste products caused byunqualified received materi</description><language>chi ; eng</language><subject>PERFORMING OPERATIONS ; POSTAL SORTING ; SEPARATING SOLIDS FROM SOLIDS ; SORTING ; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTEDPIECE-MEAL, e.g. BY PICKING ; TRANSPORTING</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20200204&amp;DB=EPODOC&amp;CC=CN&amp;NR=110743822A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20200204&amp;DB=EPODOC&amp;CC=CN&amp;NR=110743822A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>PAN YUCEN</creatorcontrib><creatorcontrib>ZHANG HUANYANG</creatorcontrib><creatorcontrib>SONG CHUNZE</creatorcontrib><creatorcontrib>LU SIYUAN</creatorcontrib><creatorcontrib>LI ZHICHAO</creatorcontrib><title>Testing device of small semiconductor refrigerator</title><description>The invention provides a testing device of a small semiconductor refrigerator. The testing device is provided with a rectangular base. A door-shaped support is mounted on the base. The door-shaped support is arranged on a platform on the base in a straddling mode. The platform is made of an insulating material. The lower portion of each supporting column of the door-shaped support is provided withan outward-protruding nylon shaft. Square metal rods sleeve the nylon shafts. Probes are fixed to the other ends of the metal rods. Each metal rod is connected to the output end of a direct-current power supply through one wire. An infrared thermometer is arranged on a horizontal cross beam of the door-shaped support. A lens of the thermometer is aligned with needle tips of two probes. The squaremetal rods can rotate around the nylon shafts, so that the probes can be lifted upwards. The testing device can screen out unqualified received materials. It is ensured that waste products caused byunqualified received materi</description><subject>PERFORMING OPERATIONS</subject><subject>POSTAL SORTING</subject><subject>SEPARATING SOLIDS FROM SOLIDS</subject><subject>SORTING</subject><subject>SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTEDPIECE-MEAL, e.g. BY PICKING</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDAKSS0uycxLV0hJLctMTlXIT1Mozk3MyVEoTs3NTM7PSylNLskvUihKTSvKTE8tSgRyeBhY0xJzilN5oTQ3g6Kba4izh25qQX58anFBYnJqXmpJvLOfoaGBuYmxhZGRozExagDyfSx4</recordid><startdate>20200204</startdate><enddate>20200204</enddate><creator>PAN YUCEN</creator><creator>ZHANG HUANYANG</creator><creator>SONG CHUNZE</creator><creator>LU SIYUAN</creator><creator>LI ZHICHAO</creator><scope>EVB</scope></search><sort><creationdate>20200204</creationdate><title>Testing device of small semiconductor refrigerator</title><author>PAN YUCEN ; ZHANG HUANYANG ; SONG CHUNZE ; LU SIYUAN ; LI ZHICHAO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN110743822A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2020</creationdate><topic>PERFORMING OPERATIONS</topic><topic>POSTAL SORTING</topic><topic>SEPARATING SOLIDS FROM SOLIDS</topic><topic>SORTING</topic><topic>SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTEDPIECE-MEAL, e.g. BY PICKING</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>PAN YUCEN</creatorcontrib><creatorcontrib>ZHANG HUANYANG</creatorcontrib><creatorcontrib>SONG CHUNZE</creatorcontrib><creatorcontrib>LU SIYUAN</creatorcontrib><creatorcontrib>LI ZHICHAO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>PAN YUCEN</au><au>ZHANG HUANYANG</au><au>SONG CHUNZE</au><au>LU SIYUAN</au><au>LI ZHICHAO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Testing device of small semiconductor refrigerator</title><date>2020-02-04</date><risdate>2020</risdate><abstract>The invention provides a testing device of a small semiconductor refrigerator. The testing device is provided with a rectangular base. A door-shaped support is mounted on the base. The door-shaped support is arranged on a platform on the base in a straddling mode. The platform is made of an insulating material. The lower portion of each supporting column of the door-shaped support is provided withan outward-protruding nylon shaft. Square metal rods sleeve the nylon shafts. Probes are fixed to the other ends of the metal rods. Each metal rod is connected to the output end of a direct-current power supply through one wire. An infrared thermometer is arranged on a horizontal cross beam of the door-shaped support. A lens of the thermometer is aligned with needle tips of two probes. The squaremetal rods can rotate around the nylon shafts, so that the probes can be lifted upwards. The testing device can screen out unqualified received materials. It is ensured that waste products caused byunqualified received materi</abstract><oa>free_for_read</oa></addata></record>
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subjects PERFORMING OPERATIONS
POSTAL SORTING
SEPARATING SOLIDS FROM SOLIDS
SORTING
SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTEDPIECE-MEAL, e.g. BY PICKING
TRANSPORTING
title Testing device of small semiconductor refrigerator
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-04T05%3A37%3A18IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=PAN%20YUCEN&rft.date=2020-02-04&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN110743822A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true