Testing device of small semiconductor refrigerator

The invention provides a testing device of a small semiconductor refrigerator. The testing device is provided with a rectangular base. A door-shaped support is mounted on the base. The door-shaped support is arranged on a platform on the base in a straddling mode. The platform is made of an insulating material. The lower portion of each supporting column of the door-shaped support is provided withan outward-protruding nylon shaft. Square metal rods sleeve the nylon shafts. Probes are fixed to the other ends of the metal rods. Each metal rod is connected to the output end of a direct-current power supply through one wire. An infrared thermometer is arranged on a horizontal cross beam of the door-shaped support. A lens of the thermometer is aligned with needle tips of two probes. The squaremetal rods can rotate around the nylon shafts, so that the probes can be lifted upwards. The testing device can screen out unqualified received materials. It is ensured that waste products caused byunqualified received materi