METHOD FOR DETERMINING PHYSICAL PROPERTIES OF SAMPLE

The invention relates to the field of materials analysis by ionising radiation, in particular x-radiation or gamma radiation. The invention proposes a method for determining physical properties of a test sample (14) using a spectrometric detector (20) with at least three channels, consisting of: per...

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Hauptverfasser: PERION DIDIER, GABORIEAU BORISSENKO ELENA
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention relates to the field of materials analysis by ionising radiation, in particular x-radiation or gamma radiation. The invention proposes a method for determining physical properties of a test sample (14) using a spectrometric detector (20) with at least three channels, consisting of: performing measurements in each of the channels on the test sample, calculating variables, each formedfrom a combination of measurements of different channels, applying a weighting and bias matrix to the variables, enabling the investigated physical properties of the test sample to be determined. 本发明涉及通过电离辐射、特别是通过x辐射或伽马辐射来进行材料分析的领域。本发明提出了一种使用具有至少三个通道的光谱检测器(20)来确定测试样本(14)的物理性质的方法,该方法包括:·在每个通道中对测试样本执行测量,·计算变量,每个变量是由不同通道的测量结果的组合而形成的,·将加权且偏置矩阵应用于变量,以使得能够确定测试样本的所研究的物理性质。