Performance testing device for low-dimensional photoelectric material

The invention relates to the technical field of low-dimensional photoelectric material testing, in particular to a performance testing device for a low-dimensional photoelectric material. The performance testing device effectively solves the problem of inaccurate results when artificial light sources are used for testing, and simultaneously solves the problem that the intensity of light irradiatedon a structure to be tested and the area of the light cannot be changed. According to the technical scheme, the performance testing device includes a bracket, a light-concentrating structure is installed at the middle position of the bracket, a reflective structure is installed at one end of the bracket, a fixing structure of a device to be tested is installed at the other end of the bracket, a power structure is installed at the bottom end of the bracket, the power structure is connected with a first transmission structure in a transmission mode, the first transmission structure is connectedwith the light-concentrat