Test pin

The invention discloses a test pin. The test pin is provided with an elastic part, a detection part and a contact part are arranged at two ends of the elastic part in the length direction respectively, so that the test pin can be extruded and deformed up and down in the Z-axis direction to obtain a...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser: BAI CHENGWEN
Format: Patent
Sprache:chi ; eng
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