Test pin

The invention discloses a test pin. The test pin is provided with an elastic part, a detection part and a contact part are arranged at two ends of the elastic part in the length direction respectively, so that the test pin can be extruded and deformed up and down in the Z-axis direction to obtain a...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: BAI CHENGWEN
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The invention discloses a test pin. The test pin is provided with an elastic part, a detection part and a contact part are arranged at two ends of the elastic part in the length direction respectively, so that the test pin can be extruded and deformed up and down in the Z-axis direction to obtain a telescopic elastic force. Different from other test pins, the elastic part is formed by connecting inclined sections and bent sections end to end to form a zigzag shape capable of stretching in the length direction, the inclined sections are inclined relative to the horizontal plane in a no-load state, and when pressure is applied, the inclined sections can be transited from a state forming a certain included angle relative to the horizontal plane, to a state parallel with the horizontal plane,and then to a state forming an included angle with the horizontal plane. The test pin with such structure has the advantages of large elastic force, long stroke, large deformability, high resilience force, and more uniform ov