Method for melting curves analysis using bifunctional PNA probe, and method for diagnosing microsatellite instability and kit for diagnosing microsatellite instability using same

The present invention relates to a method for melting curve analysis using a bifunctional PNA probe, and a method for diagnosing microsatellite instability and a kit for diagnosing microsatellite instability using the same. More specifically, the present invention relates to: a method for melting cu...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: LEE SI-SEOK, HUR DEOK-HWE, PARK HEE-KYUNG, LEE HAN-WOO
Format: Patent
Sprache:chi ; eng
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