Method for melting curves analysis using bifunctional PNA probe, and method for diagnosing microsatellite instability and kit for diagnosing microsatellite instability using same

The present invention relates to a method for melting curve analysis using a bifunctional PNA probe, and a method for diagnosing microsatellite instability and a kit for diagnosing microsatellite instability using the same. More specifically, the present invention relates to: a method for melting cu...

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Bibliographische Detailangaben
Hauptverfasser: LEE SI-SEOK, HUR DEOK-HWE, PARK HEE-KYUNG, LEE HAN-WOO
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The present invention relates to a method for melting curve analysis using a bifunctional PNA probe, and a method for diagnosing microsatellite instability and a kit for diagnosing microsatellite instability using the same. More specifically, the present invention relates to: a method for melting curve analysis according to the structure of a fluorescent PNA probe bound with different bonding strengths according to the number of deleted base mutations by using a fluorescent PNA probe capable of being specifically bound to a region in which the same bases are repeated; and a diagnosis method capable of rapidly and accurately determining microsatellite instability by detecting a gene mutation in a microsatellite marker generated by a base deletion in a region, in which the same bases are repeated, by the analysis method and by analyzing the number of base mutations that occur as a result. According to the present invention, it is possible to analyze whether a microsatellite marker gene has been deleted with hig