Embedded device function performance online test method and device and storage medium

The invention relates to an embedded device function performance online test method and device and a storage medium, and the method comprises the steps: skipping to a probe function through a skippinginstruction when a tested function is executed, wherein the first instruction of the tested function is modified into the jump instruction; when the probe function is executed, using the probe function for carrying out a performance test and calling a springboard function; when the springboard function is executed, skipping to a second instruction of the tested function so as to execute the tested function; and after the tested function is executed, returning to the probe function through the springboard function so as to complete the performance test of the tested function. According to themethod, online testing can be completed, the memory address of the target program cannot be changed, and the testing effect is guaranteed. 本发明涉及一种嵌入式装置函数性能在线测试方法、装置及存储介质，所述方法包括：执行被测试函数时，通过跳转指令跳转到探针函数；其中，将被测试函数的第一条指令被修改为所述跳转指令；