Temperature control system and method for semiconductor chip test card

The invention discloses a temperature control system and method for a semiconductor chip test card. The temperature control system comprises a test bottom plate, a test card slot, a test card functiondetection unit, a control unit and a heat dissipation unit, wherein the test card slot is arranged in the test bottom plate, the test card function detection unit is electrically connected with the test card slot and arranged on the test bottom plate, the control unit is arranged on the test bottom plate and electrically connected with the test card function detection unit, the heat dissipation unit is electrically connected with the control unit and used for adjusting the temperature of a test card, the test card is inserted into the test card slot, the test card function detection unit performs function detection on the test card, the control unit collects detection data fed back by the function detection unit, the control unit sends out a temperature adjustment signal indicating whether the temperature needs t