TEMPERATURE MEASUREMENT DEVICE USING STRAIN GAUGE
Provided is a device for measuring the temperature of a metal object without being affected by the environmental temperature. A first aspect of the present invention is a device for measuring the temperature of a metal object using at least one strain gauge, wherein the at least one strain gauge is...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | Provided is a device for measuring the temperature of a metal object without being affected by the environmental temperature. A first aspect of the present invention is a device for measuring the temperature of a metal object using at least one strain gauge, wherein the at least one strain gauge is affixed to the metal object, and the linear coefficient of expansion of the strain gauge differs from the linear coefficient of expansion of the metal object. A second aspect of the present invention is a device for measuring the temperature of a metal object using two strain gauges, wherein the twostrain gauges are affixed to the metal object, the two strain gauges have the same grid direction, the two strain gauges are used to form a Wheatstone bridge circuit, the linear coefficient of expansion of a first strain gauge among the two strain gauges is greater than the linear coefficient of expansion of the metal object, and the linear coefficient of expansion of a second strain gauge amongthe two strain gauges is l |
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