Symmetric height difference measurement method, device and system, electronic equipment and storage medium

The invention relates to a symmetric height difference measurement method, device and system, electronic equipment and a storage medium. The method comprises steps: acquiring a first picture and a second picture, which cover a preset area at least including one group of symmetric points belonging to...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: WANG BANGJUN, XU SHENGLEI, WANG JINBIN, LIAO YIZHEN, LIAO XIAOPENG
Format: Patent
Sprache:chi ; eng
Schlagworte:
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