Symmetric height difference measurement method, device and system, electronic equipment and storage medium

The invention relates to a symmetric height difference measurement method, device and system, electronic equipment and a storage medium. The method comprises steps: acquiring a first picture and a second picture, which cover a preset area at least including one group of symmetric points belonging to...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: WANG BANGJUN, XU SHENGLEI, WANG JINBIN, LIAO YIZHEN, LIAO XIAOPENG
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention relates to a symmetric height difference measurement method, device and system, electronic equipment and a storage medium. The method comprises steps: acquiring a first picture and a second picture, which cover a preset area at least including one group of symmetric points belonging to two sides of a to-be-measured target and needing height difference measurement of the to-be-measured target, of the to-be-measured target; selecting a feature point in the first picture, selecting a feature matching point matching features of the feature point in the first picture, selecting a first corresponding point and a second corresponding point which have the same geometric positions as the feature point and the feature matching point respectively in the second picture; and on the basisof the feature point, the first corresponding point, the feature matching point and the second corresponding point, calculating a height difference between the feature point and the feature matching point to carry out automat