Method for correcting space charge test under action of any voltage waveform

The invention discloses a method for correcting a space charge test under the action of any voltage waveform. The method comprises the following steps of 1) carrying out calculation to obtain a capacitance value and a resistance value of a tested sample; 2) carrying out discretization frequency spec...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	XIE ZONGLIANG, YAN JIAQI, SU XIALIN, LIU PENG, ZHANG SIYU
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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