Method for correcting space charge test under action of any voltage waveform
The invention discloses a method for correcting a space charge test under the action of any voltage waveform. The method comprises the following steps of 1) carrying out calculation to obtain a capacitance value and a resistance value of a tested sample; 2) carrying out discretization frequency spec...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a method for correcting a space charge test under the action of any voltage waveform. The method comprises the following steps of 1) carrying out calculation to obtain a capacitance value and a resistance value of a tested sample; 2) carrying out discretization frequency spectrum analysis on any waveform by utilizing fast Fourier transform to obtain the amplitudes, frequencies and phase angles of a direct-current component and each alternating-current component which form any waveform; 3) selecting proper protective resistor and isolation capacitor according to a frequency distribution range of each alternating-current component forming any waveform; 4) performing amplitude and phase correction on each alternating-current component of any waveform according to the resistance value of the selected protective resistor and the capacitance value of the isolation capacitor; and 5) adding the corrected alternating-current components and the direct-current component toobtain a corrected total |
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