Method for correcting space charge test under action of any voltage waveform

Method for correcting space charge test under action of any voltage waveform

The invention discloses a method for correcting a space charge test under the action of any voltage waveform. The method comprises the following steps of 1) carrying out calculation to obtain a capacitance value and a resistance value of a tested sample; 2) carrying out discretization frequency spec...

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Hauptverfasser: XIE ZONGLIANG, YAN JIAQI, SU XIALIN, LIU PENG, ZHANG SIYU
Format: Patent
Sprache:chi ; eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator XIE ZONGLIANG
YAN JIAQI
SU XIALIN
LIU PENG
ZHANG SIYU
description The invention discloses a method for correcting a space charge test under the action of any voltage waveform. The method comprises the following steps of 1) carrying out calculation to obtain a capacitance value and a resistance value of a tested sample; 2) carrying out discretization frequency spectrum analysis on any waveform by utilizing fast Fourier transform to obtain the amplitudes, frequencies and phase angles of a direct-current component and each alternating-current component which form any waveform; 3) selecting proper protective resistor and isolation capacitor according to a frequency distribution range of each alternating-current component forming any waveform; 4) performing amplitude and phase correction on each alternating-current component of any waveform according to the resistance value of the selected protective resistor and the capacitance value of the isolation capacitor; and 5) adding the corrected alternating-current components and the direct-current component toobtain a corrected total
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Method for correcting space charge test under action of any voltage waveform
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