Method for measuring trace elements in high-purity magnesium-based oxide by using inductively coupled plasma emission spectrometry

The invention discloses a method for measuring trace elements in high-purity magnesium-based oxide by using an inductively coupled plasma emission spectrometry. The method comprises the steps of pretreating a sample, adding a multi-element standard mixed solution of aluminum, calcium, potassium, sodium, boron, iron, manganese, cadmium, lead and sulfur or a standard solution of single-element silicon, adding hydrochloric acid, diluting, and measuring a series of standard solutions by using an inductively coupled plasma atomic emission spectrometry. A high-purity series magnesium-based oxide matrix is simulated by utilizing the general rule of emission spectra of aluminum, calcium, potassium, sodium, boron, iron, manganese, cadmium, lead, sulfur and silicon elements in inductively coupled plasma, and coexistence element and background emission spectrum research, medium determination, analysis spectral line screening, mutual interference elimination test and condition optimization betweena matrix and a spectrum