Method for measuring stray radiation of thermal infrared spectrometer

The invention discloses a method for measuring stray radiation of a thermal infrared spectrometer. The method comprises the steps of connecting a detector and a to-be-measured thermal infrared spectrometer; measuring output response curves, received after the thermal infrared spectrometer carries ou...

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Hauptverfasser: SUN DEXIN, CHAI MENGYANG, YIN ZIHAO, XU YUE, DU HAOTING, LIU YINNIAN, PENG JUN
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses a method for measuring stray radiation of a thermal infrared spectrometer. The method comprises the steps of connecting a detector and a to-be-measured thermal infrared spectrometer; measuring output response curves, received after the thermal infrared spectrometer carries out light splitting on radiation energy of a black body, of single spectral channel at different spectrometer temperature separately at same integration time; and calculating a radiation luminance response parameter of internal stray radiation of the thermal infrared spectrometer through a differencevalue, thereby quantifying an output gray value and radiation flux of the internal stray radiation of the thermal infrared spectrometer at any integration time and any spectrometer temperature. The method disclosed by the invention has universality at different spectral channels and different integration time and has great engineering practical application value, and the problem that system radiation accuracy and system q