ELECTROSTATIC CHUCK WITH FLEXIBLE WAFER TEMPERATURE CONTROL

An apparatus for processing a substrate is provided. A first coolant gas pressure system, a second coolant gas pressure system, a third coolant gas pressure system, and a fourth coolant gas pressure system are provided to provide independent gas pressures. An electrostatic chuck has a chuck surface...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: MATYUSHKIN ALEXANDER, WILCOXSON MARK H, HAO FANGLI, HOLLAND JOHN P, OZEL TANER, COMENDANT KEITH
Format: Patent
Sprache:chi ; eng
Schlagworte:
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