Hyper-spectral Mueller matrix imaging polarization measurement system
The invention relates to a hyper-spectral Mueller matrix imaging polarization measurement system, and relates to the technical field of optical imaging information collection. The system comprises a scanning light source, a first polarization modulation module, a second polarization modulation modul...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to a hyper-spectral Mueller matrix imaging polarization measurement system, and relates to the technical field of optical imaging information collection. The system comprises a scanning light source, a first polarization modulation module, a second polarization modulation module, an image obtaining device, a first collimating lens, a first imaging mirror, a second collimatinglens and a second imaging mirror; the first polarization modulation module comprises first and second SAVA polariscopes, a polarizer and a half wave plate; and the second polarization modulation module comprises third and fourth SAVA polariscopes, a polarization analyzer and a half wave plate. Compared with a traditional Mueller matrix polarization measurement system at present, the system of theinvention is not influenced by external environment factors and is higher in precision, can obtain spectral information, an intensity image and a Mueller matrix image at one time, and can provide information including form, s |
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