SYSTEM AND METHOD FOR MODELING AND CORRECTING FREQUENCY OF QUARTZ CRYSTAL OSCILLATOR

A method and system for generating a crystal model for a test product including a crystal oscillator are herein disclosed. The method includes the steps: measuring a first temperature of the test product and measuring a first frequency error of the crystal oscillator at a first calibration point during a product testing process, measuring a second temperature of the test product and measuring a second frequency error of the crystal oscillator at a second calibration point during the product testing process, estimating two parameters from the first temperature, first frequency error, second temperature, and second frequency error, and determining a 3rd order polynomial for the crystal model based on the two parameters. 在此公开一种生成包括晶体振荡器的测试产品的晶体模型的方法和系统。所述方法包括：在产品测试过程期间，在第一校准点测量测试产品的第一温度并测量晶体振荡器的第一频率误差；在产品测试过程期间，在第二校准点测量测试产品的第二温度并测量晶体振荡器的第二频率误差；从第一温度、第一频率误差、第二温度和第二频率误差估计两个参数；基于所述两个参数确定晶体模型的三阶多项式。