Method for predicting deterioration of grease, grease, and method for manufacturing grease

The invention relates to a method for predicting deterioration of grease, grease, and a method for manufacturing grease. In a method for predicting deterioration of grease, the grease is applied between a semiconductor module and a cooler. The semiconductor module accommodates a semiconductor element. The method for predicting deterioration includes predicting deterioration of the grease after specified heat cycles by using: a variable G1/G2 that is acquired by dividing an initial storage modulus G1 of the grease by an initial loss modulus G2 of the grease at an expected maximum use temperature of the semiconductor element; and distortion dD of the grease at the time when the initial storage modulus G1 and the initial loss modulus G2 have the same value. 本申请涉及预测油脂的劣化的方法、油脂以及制造油脂的方法。在预测油脂的劣化的方法中，油脂被施加在半导体模块和冷却器之间。该半导体模块容纳半导体元件。预测劣化的方法包括通过使用以下各项来预测在指定的热循环之后的油脂的劣化：通过将在半导体元件的预期最高使用温度时的油脂的初始存储模量G1除以油脂的初始损耗模量G2而获得的变量G1/G2；以及，在初始存储模量G1和初始损耗模量G2具有相同的值时的油脂的变形dD。