METHOD FOR MEASURING AN ARMATURE POSITION AND COUPLING DEVICE USING SAID METHOD

The invention relates to a method for measuring the armature position in a coil having a movable solenoid comprising an armature, which solenoid is designed as a bistable linear magnet and is controlled in a clocked manner by means of pulse width modulation, wherein the depth of the current peaks in...

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Bibliographische Detailangaben
Hauptverfasser:	BRANTWEINER STEFAN, MICK REINHARD
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	The invention relates to a method for measuring the armature position in a coil having a movable solenoid comprising an armature, which solenoid is designed as a bistable linear magnet and is controlled in a clocked manner by means of pulse width modulation, wherein the depth of the current peaks in the solenoid is measured as a measurement of the inductance and of the position of the movable armature. 本发明涉及一种用于测量在具有包括可移动的衔铁的起重磁体的线圈中的衔铁方位的方法，所述起重磁体构造成双稳定的线性磁体并且借助于脉宽调制以时钟控制的方式操控所述起重磁体，其中测量在起重磁体处的电流峰值的深度，作为可移动的衔铁的位置和电感的量值。