Defect depth detection method

The invention is suitable for the technical field of nondestructive testing, and provides a defect depth detection method, terminal equipment and a storage medium, and the method comprises the steps: obtaining an original thermal imaging image sequence, carrying out the line scanning of the original...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: LI WEI, YANG SEN, ZHENG YIJIE, XI LEIPING, ZUO XIANZHANG, MAO QIONG, HUO XIAOYAN
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention is suitable for the technical field of nondestructive testing, and provides a defect depth detection method, terminal equipment and a storage medium, and the method comprises the steps: obtaining an original thermal imaging image sequence, carrying out the line scanning of the original thermal imaging image sequence, and generating a line scanning image; extracting crack depth characteristics according to the line scanning image; and determining the depth of the defect in the original thermal imaging image sequence according to the crack depth characteristic. The embodiment of the invention provides a defect depth detection method, terminal equipment and a storage medium. A method for processing a thermal imaging image by adopting static detection in the prior art is changed; through line scanning and line scanning reconstruction, a line scanning image corresponding to the thermal imaging image sequence is obtained, high-efficiency dynamic detection is realized, and crack depth features extracte