Plant sample treatment method for X-ray instrument based element scanning

The invention provides a plant sample treatment method for X-ray instrument based element scanning. The method comprises the following steps: embedding a fresh plant sample in a fixed matrix to obtain an embedded sample; and slicing the embedded sample to obtain a sliced sample, and performing eleme...

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Hauptverfasser: MOU SHUAI, ZHENG LUQING
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention provides a plant sample treatment method for X-ray instrument based element scanning. The method comprises the following steps: embedding a fresh plant sample in a fixed matrix to obtain an embedded sample; and slicing the embedded sample to obtain a sliced sample, and performing element scanning on the sliced sample by using an X-ray instrument. A method for positioning elements in a plant body through X rays and drawing an element distribution diagram is an effective method for researching transfer and storage of the elements in the plant body, which is emerging at present. The invention provides a fresh plant sample slicing and storage method for X-ray instrument based element scanning, which has the advantages that the time period is short, the operation is simple, the requirement for treating the fresh plant sample is low, the slice thickness is controllable, the cell morphology is not deformed, the elements are not diffused and shifted, the cost is low, the body of an experimenter is not i