MEASURING DEVICE, INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND PROGRAM
This measuring device includes: a measuring unit which measures a reflection characteristic of a surface; an image capturing unit which captures an image of a measurement region of the surface of which the reflection characteristic is being measured by the measuring unit, to obtain an image of the m...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | This measuring device includes: a measuring unit which measures a reflection characteristic of a surface; an image capturing unit which captures an image of a measurement region of the surface of which the reflection characteristic is being measured by the measuring unit, to obtain an image of the measurement region; and a control unit which causes a display unit to display a plurality of measurement results obtained by means of a plurality of measurements conducted by the measuring unit. The control unit causes the display unit to display the image obtained by the image capturing unit, corresponding to a measurement result selected from among the plurality of measurement results, together with the plurality of measurement results.
本发明提供了一种测量装置,其特征在于,所述测量装置包括:测量单元,被配置为测量表面的反射特性;图像捕获单元,被配置为通过对测量单元测量其反射特性的表面上的测量区域进行图像捕获,来获得测量区域的图像;以及控制单元,被配置为使显示单元显示由测量单元通过多次测量获得的多个测量结果,其中,控制单元使显示单元将由图像捕获单元获得的与从所述多个测量结果中选择的测量结果对应的图像和所述多个测量结果一起显示。 |
---|