Mock service-based data processing method and device

The embodiment of the invention provides a Mock service-based data processing method and device. The method comprises the steps of acquiring configuration parameters of the requested Mock service in aMock service request; in a pre-established first database, searching Mock data matched with the acqu...

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Bibliographische Detailangaben
Hauptverfasser: XIAO DECHAO, GONG ZHAOGANG
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The embodiment of the invention provides a Mock service-based data processing method and device. The method comprises the steps of acquiring configuration parameters of the requested Mock service in aMock service request; in a pre-established first database, searching Mock data matched with the acquired configuration parameters, wherein the first database stores Mock data associated with the requested Mock service, and returns the found Mock data to a second database. The dimension of the test point is increased, and the success rate of testing the function point is improved. 本发明实施例提供一种基于Mock服务的数据处理方法及装置,所述方法包括:获取Mock服务请求中被请求Mock服务的配置参数;在预先建立的第一数据库中,查找与获取的所述配置参数相匹配的Mock数据,其中,所述第一数据库中存放与所述被请求Mock服务相关联的Mock数据将查找到的Mock数据返回到第二数据库中,增加了测试点的维度,提高了测试功能点的成功率。