Semiconductor Wafer and Method for Forming Semiconductor

The embodiment of the invention provides a semiconductor wafer and a method for forming a semiconductor. The semiconductor wafer includes: a first semiconductor component having a first device; a second semiconductor component having a second device; an insulation layer laterally extending to the fi...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: YUKI TANAKA, SHINJI KUDOH, TOMONORI HOTATE, HIROSHI SHIKAUCHI
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The embodiment of the invention provides a semiconductor wafer and a method for forming a semiconductor. The semiconductor wafer includes: a first semiconductor component having a first device; a second semiconductor component having a second device; an insulation layer laterally extending to the first semiconductor component and the second semiconductor component; and a grind layer configured onor adjacent to a backside of the semiconductor wafer. Therefore, chipping or cracking can be decreased or avoided when the grind layer is exposed during the thinning process (such as backside grinding). 本发明实施例提供一种半导体晶片以及形成半导体的方法。该半导体晶片包括:第一半导体元件,该第一半导体元件具有第一器件;第二半导体元件,该第二半导体元件具有第二器件;绝缘层,该绝缘层侧向延伸到该第一半导体元件和该第二半导体元件;以及研磨层,该研磨层配置在该半导体晶片的背面上或临近于该半导体晶片的背面。因此,在制薄过程中(例如背面研磨)将研磨层暴露时,可以减少或避免碎屑或裂纹。