High-temperature superconductive thin film microwave surface resistance testing instrument and method

The present invention belongs to the techn field of superconductance electronics, and the said instrument comprises test base, sample to be tested, holder plate, sealing top and two calibration parts. Owing to its fixed test stand, resonant TE 001+ delta cube mode, "zero surface resistance"...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	ZHANG QISHAO, LU JIAN
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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