High-temperature superconductive thin film microwave surface resistance testing instrument and method
The present invention belongs to the techn field of superconductance electronics, and the said instrument comprises test base, sample to be tested, holder plate, sealing top and two calibration parts. Owing to its fixed test stand, resonant TE 001+ delta cube mode, "zero surface resistance"...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | The present invention belongs to the techn field of superconductance electronics, and the said instrument comprises test base, sample to be tested, holder plate, sealing top and two calibration parts. Owing to its fixed test stand, resonant TE 001+ delta cube mode, "zero surface resistance" calibration utilizing symmetrical structure and the formula Qo=A+BRs proposed, the present invention realizes high-sensitivity and high-accuracy non-destructive measurement of Rs, the microwave surface resistance of superconductive thin film. |
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