X-ray two-dimensional phase-contrast imaging method of single exposure
The invention discloses an X-ray two-dimensional phase-contrast imaging method of single exposure. The method specifically includes following steps: during imaging, a detected object is arranged between a first encoding diaphragm M and an area array detector and close to the first encoding diaphragm...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses an X-ray two-dimensional phase-contrast imaging method of single exposure. The method specifically includes following steps: during imaging, a detected object is arranged between a first encoding diaphragm M and an area array detector and close to the first encoding diaphragm M, the change of the intensity and the direction of the X-ray is caused by absorption and refraction of the X-ray by the detected object, the ray intensities I1, I2, I3 and I4 detected by pixels of the detector are changed, quantified phase and absorption information can be extracted by employing relative changes thereof, and two-dimensional phase-contrast imaging of the X-ray of single exposure is realized. The beneficial effects of the method are that the acquisition process is simplified, original secondary exposure is simplified as single exposure, the imaging time and the irradiation dose are reduced by 50% compared with that of the original method, the mode of single exposure can realize dynamic and online p |
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